A 0.61THz (top) and 0.57THz (bottom) signal source in 28nm bulk CMOS with integrated antenna for non-destructive testing

“A THz Signal Source with Integrated Antenna for Non-Destructive Testing in 28nm Bulk CMOS”
Presented at A-SSCC 2015
Winner “Best Design Award” of the A-SSCC Student Design Contest

Wouter Steyaert, Patrick Reynaert
KU Leuven ESAT-MICAS – 2015

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